Dr. Lyuan Xu is an Assistant Professor in the Department of Electrical Engineering and Renewable Energy (EERE). He earned his B.S. in Applied Physics from the University of Science and Technology of China, and his M.S. and Ph.D. in Electrical and Computer Engineering from Vanderbilt University. His early research focused on advanced semiconductor technologies, particularly reliability challenges in 7-nm FinFET devices, including single-event upsets, thermal neutron–induced soft errors, and high-current latchup-like phenomena, etc.. Later, his work expanded to the study of functional brain networks, investigating white–gray matter connectivity changes in aging and Alzheimer’s disease using advanced graph models and deep learning. He has published extensively in both electrical engineering and neuroimaging, advancing integrated circuit reliability and deepening insights into brain network organization and neurological disorders.